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Journal Articles

A Study of surface stripper for the AMS system with a footprint below 2 m 2 m

Matsubara, Akihiro; Fujita, Natsuko; Kimura, Kenji

Proceedings of the 8th East Asia Accelerator Mass Spectrometry Symposium and the 22nd Japan Accelerator Mass Spectrometry symposium (EA-AMS 8 & JAMS-22), p.57 - 59, 2020/00

no abstracts in English

Journal Articles

Measurement of neutron scattering cross section of nano-diamond with particle diameter of approximately 5 nm in energy range of 0.2 meV to 100 meV

Teshigawara, Makoto; Tsuchikawa, Yusuke*; Ichikawa, Go*; Takata, Shinichi; Mishima, Kenji*; Harada, Masahide; Oi, Motoki; Kawamura, Yukihiko*; Kai, Tetsuya; Kawamura, Seiko; et al.

Nuclear Instruments and Methods in Physics Research A, 929, p.113 - 120, 2019/06

https://doi.org/10.1016/j.nima.2019.03.038

Times Cited Count：16 Percentile：86.05(Instruments & Instrumentation)

A nano-diamond is an attractive neutron reflection material below cold neutron energy. The total neutron cross section of a nano-diamond was derived from a neutron transmission measurement over the neutron energy range of 0.2 meV to 100 meV because total neutron cross section data were not available. The total cross section of a nano-diamond with particle size of approximately 5 nm increased with a decrease in neutron energy to 0.2 meV. It was approximately two orders of magnitude larger than that of graphite at 0.2 meV. The contribution of inelastic scattering to the total cross section was to be shown negligible small at neutron energies of 1.2, 1.5, 1.9, 2.6, and 5.9 meV in the inelastic neutron scattering measurement. Moreover, small-angle neutron scattering measurements of the nano-diamond showed a large scattering cross section in the forward direction for low neutron energies.

Journal Articles

Chemical states of trace-level strontium adsorbed on layered oxide by XPS and XANES under total reflection condition

Baba, Yuji; Shimoyama, Iwao

Photon Factory Activity Report 2016, 2 Pages, 2017/00

http://pfwww.kek.jp/acr/2016pdf/u_reports/pf16b0047.pdf

In order to elucidate the adsorption states of radioactive Sr-90 in soil, chemical bonding states of non-radioactive strontium adsorbed on layered oxide (mica) have been investigated by X-ray photoelectron spectroscopy (XPS) and X-ray absorption near edge structure (XANES) spectroscopy. Since the number of atoms in radioactive Sr-90 is extremely small, the XPS and XANES were measured under total reflection condition of the incident X-rays. The detection limit in total reflection XPS was about 150 pg/cm $^{2}$ , which corresponds to 300 Bq of Sr-90. The Sr 2p $_{3/2}$ core-level energy in XPS shifted to lower energy with the decrease in the thickness of Sr layer. Also, the Sr 2p $_{3/2}$ Sr 4d $^{*}$ resonance energy in XANES shifts to lower energy with the decrease in the thickness. On the basis of a simple point charge model, it was elucidated that the chemical bond between Sr and mica surface becomes ionic with the decrease in the adsorbed amount of strontium.

Journal Articles

Interaction between ultra-trace amount of cesium and oxides studied by total-reflection X-ray photoelectron spectroscopy

Baba, Yuji; Shimoyama, Iwao; Hirao, Norie; Izumi, Toshinori

e-Journal of Surface Science and Nanotechnology (Internet), 13, p.417 - 421, 2015/09

https://doi.org/10.1380/ejssnt.2015.417

Times Cited Count：1

The interaction between alkali metals and oxides has attracted much attention as heterogeneous catalysis, chemical reaction promoters, and high intensity electron emitter. Also the interaction of cesium and oxides has become important subject, because radioactive cesium trapped in minerals such as clay and soil may cause health risks. In the present study, we analyzed chemical states of ultra-trace amount of cesium on oxide surfaces by total reflection X-ray photoelectron spectroscopy (TR-XPS) exited by synchrotron radiation. For the adsorbed cesium thicker than 0.01 layer, cesium is weakly bound with oxide through Van-der-Waals force. On the other hand, for ultra-thin layer about 0.002 layer, the chemical bond changes to covalent bond. It is suggested that this change in the chemical bonding state is one of the reasons why radioactive cesium is hard to be released from minerals.

Journal Articles

Study of interdiffused layers in the surface and interfaces of multilayers by total-reflection soft-X-ray fluorescence spectroscopy

Imazono, Takashi; Yanagihara, Mihiro*

Photon Factory News, 22(3), p.18 - 22, 2004/11

Using soft-X-ray fluorescence spectroscopy with photon incidence at a critical angle of total reflection, it was made clear that SiO existed within a depth of a few nanometers from the surface of Fe/Si multilayers. It was generated by oxidation of the interdiffused FeSi layer nearest to the topmost Fe layer. Consequently, the FeSi layer was found to decrease in thickness. This result suggests that the total-reflection soft-X-ray fluorescence spectroscopy is fairly useful to analyze the chemical state of elements to a depth of a few nanometers from the surface.